Intrinsic l/f noise in doped silicon thermistors for cryogenic calorimeters

被引：19

作者：

Han, SI ^{[1
]}

Almy, R ^{[1
]}

Apodaca, E ^{[1
]}

Bergmann, W ^{[1
]}

Deiker, S ^{[1
]}

Lesser, A ^{[1
]}

McCammon, D ^{[1
]}

Rawlins, K ^{[1
]}

Kelley, RL ^{[1
]}

Moseley, SH ^{[1
]}

Porter, FS ^{[1
]}

Stahle, CK ^{[1
]}

Szymkowiak, AE ^{[1
]}

机构：

[1] Univ Wisconsin, Dept Phys, Madison, WI 53706 USA

来源：

EUV, X-RAY, AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY IX | 1998年 / 3445卷

关键词：

detectors; calorimeters; bolometers; x-ray; infrared; 1/f noise;

D O I：

10.1117/12.330329

中图分类号：

P1 [天文学];

学科分类号：

0704 ;

摘要：

We have characterized the intrinsic 1/f noise of ion-implanted silicon thermistors in the 0.05 - 0.5 K temperature range. This noise can have a significant effect on detector performance and needs to be taken into account in the design optimization of infrared bolometers and x-ray microcalorimeters. The noise can be reasonably well fit as Delta R/R fluctuations whose spectral density varies as 1/f and increases steeply with lower doping density and lower temperatures. The observed 1/f noise can be approximated as a resistance fluctuation: [Delta R-2]/R-2 = 0.034(T-0/1K)(2.453)(T-e/0.15K)(-(5.2+0.9 log(T0)))/(3.5 x 10(18) cm(-3) V-therm f).

引用

页码：640 / 644

页数：5