Goodness-of-fit tests for GEE modeling with binary responses

被引:62
作者
Barnhart, HX
Williamson, JM
机构
[1] Emory Univ, Rollins Sch Publ Hlth, Dept Biostat, Atlanta, GA 30322 USA
[2] Ctr Dis Control & Prevent, Div HIV AIDS Prevent Surveillance & epidemiol E48, Atlanta, GA 30333 USA
关键词
correlated data; GEE modeling; goodness-of-fit test; logistic regression; score test;
D O I
10.2307/3109778
中图分类号
Q [生物科学];
学科分类号
07 ; 0710 ; 09 ;
摘要
Analysis of data with repeated measures is often accomplished through the use of generalized estimating equations (GEE) methodology. Although methods exist for assessing the adequacy of the fitted models for uncorrelated data with likelihood methods, it is not appropriate to use these methods for models fitted with GEE methodology. We propose model-based and robust (empirically corrected) goodness-of-fit tests for GEE modeling with binary responses based on partitioning the space of covariates into distinct regions and forming score statistics that are asymptotically distributed as chi-square random variables with the appropriate degrees of freedom. The null distribution and the statistical power of the proposed goodness-of-fit tests were assessed using simulated data. The proposed goodness-of-fit tests are illustrated by two examples using data from clinical studies.
引用
收藏
页码:720 / 729
页数:10
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