A magnetic force microscopy and Kerr effect study of magnetic domains and cross-tie walls in magnetoresistive NiFe shapes

被引：6

作者：

Joisten, H ^{[1
]}

Lagnier, S

Vaudaine, MH

Vieux-Rochaz, L

Porteseil, JL

机构：

[1] CMI, STMC, DMITEC, LETI, F-38054 Grenoble 9, France

[2] CNRS, Lab Louis Neel, F-38042 Grenoble, France

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 2001年 / 233卷 / 03期

关键词：

magnetoresistive NiFe films; Kerr effect; magnetic force microscopy; domains; cross-tie walls;

D O I：

10.1016/S0304-8853(01)00059-2

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Magnetic domains were observed in 350 Angstrom NiFe films. Cross-tie domain walls and ripple structures were observed inside the domains by MFM. The perturbative effect of the standard CoCr MFM tip on the magnetic microstructure was brought to evidence. A demagnetized, low-coercivity Fe tip gave the best images. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：230 / 235

页数：6

共 5 条

[1]

CIUREANU P, 1992, THIN FILM RESISTIVE, P264

[2]

COQUAZ C, 1992, THESIS U J FOURIER G

[3]

Hubert A., 1998, MAGNETIC DOMAINS ANA, P240

[4] Discovery of cross-tie walls at saw-tooth magnetic domain boundaries in permalloy films [J].