Planar superconductor-normal-superconductor Josephson junctions in MgB2

被引:69
作者
Burnell, G
Kang, DJ
Lee, HN
Moon, SH
Oh, B
Blamire, MG
机构
[1] Univ Cambridge, Dept Mat Sci, Cambridge CB2 3QZ, England
[2] LG Elect Inst Technol, Seoul 137724, South Korea
关键词
D O I
10.1063/1.1419041
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the successful creation of planar MgB2 junctions by localized ion damage in thin (100 nm) films of MgB2 on sapphire by milling a 50 nm trench with a focused-ion beam across tracks of widths between 1 and 5 mum. When the depth of the trench is between 70% and 80% of the film thickness, devices show critical currents (I-C) for temperatures below 25 K. The I-C of these devices is strongly modulated by applied microwave radiation and magnetic field. The product of the critical current and normal state resistance (ICRN) is remarkably high, implying a potential for very-high-frequency applications. (C) 2001 American Institute of Physics.
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页码:3464 / 3466
页数:3
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