Bulk crystals to surfaces: Combining X-ray diffraction and atomic force microscopy to probe the structure and formation of crystal interfaces

The characterization of crystal interfaces and organized molecular arrays were investigated with X-ray diffraction and atomic force microscopy. The combination of interface structure characterization, kinetic measurements and bulk single crystal X-ray diffraction enabled the elucidation of the growth of crystals. The study of the molecular properties of the organized interfaces were important for developing strategies for controlling nucleation of crystalline phases and for the synthesis of specific polymorphs and thin crystalline films.