Lifetime prediction and design of reliability tests for high-power devices in automotive applications

被引:125
作者
Ciappa, M [1 ]
Carbognani, F [1 ]
Fichtner, W [1 ]
机构
[1] ETH, Swiss Fed Inst Technol, Integrated Syst Lab, Zurich, Switzerland
关键词
automotive electronics; hybrid vehicles; lifetime prediction; power devices;
D O I
10.1109/TDMR.2003.818148
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 [电气工程]; 0809 [电子科学与技术];
摘要
Different procedures are defined and compared to extract the statistical distribution of the thermal cycles experienced by power devices that are installed in hybrid vehicles and operated according to arbitrary mission profiles. This enables both to design efficient accelerated tests tailored on realistic data and to provide the input for lifetime prediction models. Initially, the system lifetime is predicted under the assumption of linear accumulation of the damage produced by low cycling fatigue. Also, a novel prediction model based on some fundamental equations is introduced which takes into consideration the creep experienced by compliant materials when they are submitted to thermal cycles.
引用
收藏
页码:191 / 196
页数:6
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