Linewidth measurements of MEMS-based tunable lasers for phase-locking applications

被引：32

作者：

Ip, E ^{[1
]}

Kahn, JM

Anthon, D

Hutchins, J

机构：

[1] Stanford Univ, Dept Elect Engn, Stanford, CA 94305 USA

[2] Iolon, San Jose, CA 95131 USA

来源：

IEEE PHOTONICS TECHNOLOGY LETTERS | 2005年 / 17卷 / 10期

基金：

美国国家科学基金会;

关键词：

frequency stability; laser measurement; laser tuning; microelectromechanical devices; phase jitter; phase-locked loops; phase noise; synchronous detection;

D O I：

10.1109/LPT.2005.856435

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 [电气工程]; 0809 [电子科学与技术];

摘要：

We have used two techniques - the beat spectrum method and the frequency noise spectrum method - to measure linewidths of microelectromechanical systems (MEMS)-based tunable external cavity lasers (ECLs) in the C-band (1527-1567 nm). The two techniques yield similar results, but the latter is able to measure narrow linewidths more accurately in the presence of frequency jitter. The MEMS-based ECL linewidths are found to be inversely proportional to output powers over a wide range of powers. At output powers of 12 dBm, the beat linewidth is no more than 30 kHz, corresponding to per-laser linewidths of about 15 kHz. We show that these lasers are suitable for coherent detection of quadrature phase-shift keying.

引用

页码：2029 / 2031

页数：3

共 6 条

[1]

SUBMERSIBLE OBSERVATIONS OF AN ICEBERG PIT AND SCOUR ON THE GRAND-BANKS OF NEWFOUNDLAND [J].