GenX:: an extensible X-ray reflectivity refinement program utilizing differential evolution

被引：812

作者：

Bjorck, Matts ^{[1
]}

Andersson, Gabriella ^{[1
]}

机构：

[1] Uppsala Univ, Dept Phys, SE-75121 Uppsala, Sweden

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2007年 / 40卷

关键词：

D O I：

10.1107/S0021889807045086

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

GenX is a versatile program using the differential evolution algorithm for fitting X-ray and neutron reflectivity data. It utilizes the Parratt recursion formula for simulating specular reflectivity. The program is easily extensible, allowing users to incorporate their own models into the program. This can be useful for fitting data from other scattering experiments, or for any other minimization problem which has a large number of input parameters and/or contains many local minima, where the differential evolution algorithm is suitable. In addition, GenX manages to fit an arbitrary number of data sets simultaneously. The program is released under the GNU General Public License.

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收藏

页码：1174 / 1178

页数：5

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