Effect of sample size on deformation in amorphous metals

被引：382

作者：

Volkert, C. A. ^{[1
]}

Donohue, A. ^{[2
]}

Spaepen, F. ^{[2
]}

机构：

[1] Univ Gottingen, Inst Mat Phys, D-37077 Gottingen, Germany

[2] Harvard Sch Engn & Appl Sci, Cambridge, MA 02138 USA

来源：

JOURNAL OF APPLIED PHYSICS | 2008年 / 103卷 / 08期

关键词：

D O I：

10.1063/1.2884584

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Uniaxial compression tests were performed on micron-sized columns of amorphous PdSi to investigate the effect of sample size on deformation behavior. Cylindrical columns with diameters between 8 mu m and 140 nm were fabricated from sputtered amorphous Pd(77)Si(23) films on Si substrates by focused ion beam machining and compression tests were performed with a nanoindenter outfitted with a flat diamond punch. The columns exhibited elastic behavior until they yielded by either shear band formation on a plane at 50 degrees to the loading axis or by homogenous deformation. Shear band formation occurred only in columns with diameters larger than 400 nm. The change in deformation mechanism from shear band formation to homogeneous deformation with decreasing column size is attributed to a required critical strained volume for shear band formation. (c) 2008 American Institute of Physics.

引用

页数：6

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