Defect identification using the core-electron contribution in Doppler-broadening spectroscopy of positron-annihilation radiation

被引：116

作者：

Szpala, S ^{[1
]}

AsokaKumar, P ^{[1
]}

Nielsen, B ^{[1
]}

Peng, JP ^{[1
]}

Hayakawa, S ^{[1
]}

Lynn, KG ^{[1
]}

Gossmann, HJ ^{[1
]}

机构：

[1] AT&T BELL LABS, MURRAY HILL, NJ 07974 USA

来源：

PHYSICAL REVIEW B | 1996年 / 54卷 / 07期

关键词：

D O I：

10.1103/PhysRevB.54.4722

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Reduction of background using a coincidence-detection system in Doppler-broadening spectroscopy of positron-annihilation radiation allows us to examine the contribution of high-momentum core electrons. The contribution is used as a fingerprint to identify chemical variations at a defect site. The technique is applied to study a variety of open volume defects in Si, including decorated vacancies associated with doping.

引用

页码：4722 / 4731

页数：10

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