Subdiffraction far-field imaging of luminescent single-walled carbon nanotubes

被引：34

作者：

Cognet, Laurent ^{[1
,2
,3
]}

Tsyboulski, Dmitri A. ^{[1
,2
]}

Weisman, R. Bruce ^{[1
,2
]}

机构：

[1] Rice Univ, Dept Chem, Richard E Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USA

[2] Rice Univ, Ctr Biol & Environm Nanotechnol, Houston, TX 77005 USA

[3] Univ Bordeaux 1, Ctr Phys Mol Opt & Hertzienne, F-33405 Talence, France

来源：

NANO LETTERS | 2008年 / 8卷 / 02期

关键词：

D O I：

10.1021/nl0725300

中图分类号：

O6 [化学];

学科分类号：

0703 [化学];

摘要：

Far-field near-infrared fluorescence microscopy of single-walled carbon nanotubes (SWNTs) has been hampered by the diffraction limit to resolution. A new analysis method is presented that allows subwavelength (lambda/10) mapping of single-molecule chemical reaction sites on semiconducting SWNTs, enabling precise localization of excitonic luminescence regions along the nanotube axis through a nonperturbing, far-field optical measurement. This method is applied to reveal the subdiffraction lengths, curvatures, and defects of luminescent SWNTs in unprecedented detail.

引用

收藏

页码：749 / 753

页数：5

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