Geminate charge recombination with distance-dependent intrinsic reaction rate: Escape probability and its electric field effect

被引：21

作者：

Wojcik, M

Tachiya, M

机构：

[1] Tech Univ Lodz, Inst Appl Radiat Chem, PL-93590 Lodz, Poland

[2] Natl Inst Adv Ind Sci & Technol, Tsukuba, Ibaraki 3058565, Japan

来源：

RADIATION PHYSICS AND CHEMISTRY | 2005年 / 74卷 / 3-4期

关键词：

D O I：

10.1016/j.radphyschem.2005.04.005

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We calculate the electric field dependence of the probability of escape from geminate recombination in the case of a finite, distance-dependent intrinsic reaction rate. We solve a partial differential equation for the escape probability using a numerical method. We assess the role of finite-reactivity effects in geminate recombination and discuss their possible consequences for interpretation of experimental data. (C) 2005 Elsevier Ltd. All rights reserved.

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页码：132 / 138

页数：7

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