Roughness induced in plane uniaxial anisotropy in ultrathin Fe films

被引:43
作者
Wolfe, JH
Kawakami, RK
Ling, WL
Qiu, ZQ
Arias, R
Mills, DL
机构
[1] Univ Calif Irvine, Dept Phys & Astron, Irvine, CA 92697 USA
[2] Univ Calif Berkeley, Dept Phys, Berkeley, CA 94720 USA
关键词
ultrathin magnetic films; anisotropy; SMOKE; hysteresis loops; surface roughness;
D O I
10.1016/S0304-8853(01)00016-6
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We have studied roughness induced in plant anisotropy, for ultrathin F-2 films grown on MgO(1 0 0). When the films are grown, the deposition beam is directed toward the substrate at non-normal incidence, to produce a rough outer surface, with anisotropic roughness. We measure the roughness induced in plane anisotropy fields for several samples with SMOKE, and we also perform STM measurements of the actual surface profile. This allows us to calculate the roughness induced in plane anisotropy produced by the dipolar mechanism, with no adjustable parameters. using the theory of Arias and Mills. Comparison between theory and experiment shows that anisotropy of dipolar origin is a major source of extrinsic in plane anisotropy. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:36 / 45
页数:10
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