Demonstration of emittance compensation through the measurement of the slice emittance of a 10-ps electron bunch

被引：53

作者：

Qiu, X

Batchelor, K

BenZvi, I

Wang, XJ

机构：

[1] National Synchrotron Light Source Department, Brookhaven National Laboratory, Upton, NY

来源：

PHYSICAL REVIEW LETTERS | 1996年 / 76卷 / 20期

关键词：

D O I：

10.1103/PhysRevLett.76.3723

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

The beam matrix of a picosecond long slice of an electron bunch was measured. A short slice is selected out of an energy chirped beam by a slit in a dispersive region. The emittance is measured using the quadrupole scan technique. We observe the process of emittance compensation of the beam by repeating the measurement for various values of the compensating solenoid and for several slices.

引用

页码：3723 / 3726

页数：4

共 6 条

[1] NEW PHOTOELECTRIC INJECTOR DESIGN FOR THE LOS-ALAMOS-NATIONAL-LABORATORY XUV FEL ACCELERATOR [J].