Applicability of X-ray reflectometry to studies of polymer solar cell degradation

被引：11

作者：

Andreasen, Jens Wenzel ^{[1
]}

Gevorgyan, Suren A. ^{[1
]}

Schleputz, Christian M. ^{[2
]}

Krebs, Frederik Christian ^{[1
]}

机构：

[1] Tech Univ Denmark, Riso Natl Lab Sustainable Energy, DK-4000 Roskilde, Denmark

[2] Paul Scherrer Inst, Swiss Light Source, CH-5232 Villigen, Switzerland

来源：

SOLAR ENERGY MATERIALS AND SOLAR CELLS | 2008年 / 92卷 / 07期

关键词：

organic; polymer; X-ray reflectivity; stability; degradation;

D O I：

10.1016/j.solmat.2008.02.011

中图分类号：

TE [石油、天然气工业]; TK [能源与动力工程];

学科分类号：

0807 ; 0820 ;

摘要：

Although degradation of polymer solar cells is widely acknowledged, the cause, physical or chemical, has not been identified. The purpose of this work is to determine the applicability of X-ray reflectometry for in situ observation of physical degradation mechanisms. We find that the rough interfaces of the polymer solar cell constituent layers seriously obstruct the sensitivity of the technique, rendering it impossible to elucidate changes in the layer/interface structure at the sub-nanometer level. (c) 2008 Elsevier B.V. All rights reserved.

引用

页码：793 / 798

页数：6

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