Predicted properties of microhollow cathode discharges in xenon

被引：129

作者：

Boeuf, JP ^{[1
]}

Pitchford, LC

Schoenbach, KH

机构：

[1] CNRS, UMR 5002, CPAT, F-31062 Toulouse, France

[2] Old Dominion Univ, Ctr Bioelect, Norfolk, VA 23529 USA

来源：

APPLIED PHYSICS LETTERS | 2005年 / 86卷 / 07期

基金：

美国国家科学基金会;

关键词：

D O I：

10.1063/1.1862781

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A fluid model has been developed and used to help clarify the physical mechanisms occurring in microhollow cathode discharges (MHCD). Calculated current-voltage (I-V) characteristics and gas temperatures in xenon at 100 Torr are presented. Consistent with previous experimental results in similar conditions, we find a voltage maximum in the I-V characteristic. We show that this structure reflects a transition between a low-current, abnormal discharge localized inside the cylindrical hollow cathode to a higher-current, normal glow discharge sustained by electron emission from the outer surface of the cathode. This transition, due to the geometry of the device, is a factor contributing to the well-known stability of MHCDs. (C) 2005 American Institute of Physics.

引用

页码：1 / 3

页数：3

共 13 条

[1] 2-DIMENSIONAL MODEL OF A CAPACITIVELY COUPLED RF DISCHARGE AND COMPARISONS WITH EXPERIMENTS IN THE GASEOUS ELECTRONICS CONFERENCE REFERENCE REACTOR [J].