Optimal intensity-modulation projection technique for three-dimensional shape measurement

被引:10
作者
Lu, CW
Xiang, LM
机构
[1] Fukuoka Inst Technol, Dept Elect & Informat, Higashi Ku, Fukuoka 8110295, Japan
[2] Kyushu Sangyo Univ, Dept Informat, Higashi Ku, Fukuoka 8138503, Japan
关键词
D O I
10.1364/AO.42.004649
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A new pattern projection technique for measuring three-dimensional topography is presented, called the optimal intensity-modulation projection technique. The proposed technique dramatically shortens the measurement time and improves stripe detection accuracy compared with previous methods. Furthermore, the method deals reliably with discontinuous patterns and multiple objects. (C) 2003 Optical Society of America.
引用
收藏
页码:4649 / 4657
页数:9
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