Application of positron annihilation lifetime spectroscopy in studies of crystallization processes

被引：11

作者：

Jasinska, B

Dawidowicz, AL

Pikus, S

机构：

[1] Marie Curie Sklodowska Univ, Inst Phys, PL-20031 Lublin, Poland

[2] Marie Curie Sklodowska Univ, Fac Chem, Dept Chem Phys, PL-20031 Lublin, Poland

[3] Marie Curie Sklodowska Univ, Fac Chem, Dept Crystallog, PL-20031 Lublin, Poland

来源：

PHYSICAL CHEMISTRY CHEMICAL PHYSICS | 2003年 / 5卷 / 15期

关键词：

D O I：

10.1039/b304588a

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

This study concerns the crystallization process observed in three-component Vycor glass heated in the temperature range from 875 to 975 K. PALS and X-ray diffraction results confirmed partial crystallization of silica in the studied material depending on the time and temperature of thermal treatment. It is shown that PALS can be treated as a new method for investigation of the crystallinity degree. Increased crystallization degree obtained from X-ray diffraction data is perfectly correlated with o-Ps intensity decrease determined from PALS spectra for each temperature.

引用

页码：3289 / 3293

页数：5

共 28 条

[1]

[Anonymous], XRAY DIFFRACTION PRO

[2]

Brauer G., 1987, Diffusion and Defect Data, V53-54, P173

[3] VACANCY-TYPE DEFECTS IN CRYSTALLINE AND AMORPHOUS SIO2 [J].