Thickness dependence of the stability of the charge-ordered state in Pr0.5Ca0.5MnO3 thin films

被引：79

作者：

Prellier, W ^{[1
]}

Simon, C ^{[1
]}

Haghiri-Gosnet, AM ^{[1
]}

Mercey, B ^{[1
]}

Raveau, B ^{[1
]}

机构：

[1] CNRS UMR 6508, Lab CRISMAT, F-14050 Caen, France

来源：

PHYSICAL REVIEW B | 2000年 / 62卷 / 24期

关键词：

D O I：

10.1103/PhysRevB.62.R16337

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Thin films of the charge-ordered (CO) compound Pr0.5Ca0.5MnO3 have been deposited onto (100)-oriented SrTiO3 substrates using pulsed laser deposition. Magnetization and transport properties are measured when the thickness of the him is varied. While the thinner films do not exhibit any temperature-induced insulator-metal transition under an applied magnetic field up to 9 T, for thickness larger than 1100 Angstrom a 5 T magnetic field is sufficient to melt the CO state. We have established the temperature-field phase diagram and compared it to the bulk material. It indicates that the robustness of the CO state in thin films depends strongly on the strains and the thickness. We proposed an explanation based on the distortion of the cell of the film.

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收藏

页码：R16337 / R16340

页数：4

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