Extremely large N content (up to 10%) in GaNAs grown by gas-source molecular beam epitaxy

被引:98
作者
Kondow, M
Uomi, K
Kitatani, T
Watahiki, S
Yazawa, Y
机构
[1] RWCP Optoelectronics Hitachi Lab., c/o Central Research Laboratory, Hitachi, Ltd., Tokyo 185, 1-280 Higashi-Koigakubo, Kokubunji
[2] Central Research Laboratory, Hitachi, Ltd., Kokubunji, Tokyo 185
关键词
D O I
10.1016/0022-0248(96)00008-5
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
GaNAs/GaP strained single quantum wells are fabricated on Gap wafers by gas-source molecular beam epitaxy in which a nitrogen radical is used as the nitrogen source. The structure and luminescence properties of the quantum wells are investigated by transmission electron microscopy and photoluminescence measurements. The N content in the GaNAs quantum wells was estimated to be about 10%, which is about one order of magnitude larger than previously reported and more than sufficient for fabricating laser diodes on a Si wafer.
引用
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页码:175 / 179
页数:5
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