Temperature-dependent Sellmeier equation for the refractive index of AlxGa1-xAs

被引：35

作者：

Kim, Jang Pyo ^{[1
]}

Sarangan, Andrew M. ^{[1
]}

机构：

[1] Univ Dayton, Elect Opt Program, Dayton, OH 45469 USA

来源：

OPTICS LETTERS | 2007年 / 32卷 / 05期

关键词：

D O I：

10.1364/OL.32.000536

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We derived a temperature-dependent Sellmeier equation for AlxGa1-xAs material by measuring the refractive index of GaAs and AlAs with temperature dependence in a resonant cavity enhanced structure. The equation is applicable in the range of 1460-1580 nm and 26-86 degrees C and can be extrapolated to the other wavelengths and temperature ranges as well. (c) 2007 Optical Society of America.

引用

页码：536 / 538

页数：3

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