Development of PE-CVD Si/CN:H films for tribological and corrosive complex-load conditions

被引:52
作者
Probst, D
Hoche, H
Zhou, Y
Hauser, R
Stelzner, T
Scheerer, H
Broszeit, E
Berger, C
Riedel, R
Stafast, H
Koke, E
机构
[1] Tech Univ Darmstadt, MPA IfW, D-64283 Darmstadt, Germany
[2] Tech Univ Darmstadt, FG DF, D-64287 Darmstadt, Germany
[3] IPHT, D-07745 Jena, Germany
[4] Univ Konstanz, Dept Chem, D-78464 Constance, Germany
关键词
SiCN; PA-CVD; PE-CVD; mechanical properties; tribology;
D O I
10.1016/j.surfcoat.2005.02.111
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Amorphous Si/C/N:H where synthesized by plasma enhanced chemical vapor deposition (PE-CVD) using the single-source precursors hexamethyldisilazane (HMDS) and bis(trimethylsilyl)carbodiimide (BTSC). The films produced using the HMDS precursor were rich in carbon, while the films synthesized from the BTSC precursor were high in nitrogen content. All films were amorphous and exhibited a similar hardness to SiC or Si3N4. Fundamental properties of the films were determined in tests such as ultra micro-hardness, elastic modulus, thickness and adhesion. To investigate the composition of the films, composition depth profiles were determined by GDOES. The wear behaviour was studied in sliding tests under oscillating motion. To investigate the wear mechanisms, the wear tracks were examined with topographical analysis, REM as well as EDX. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:355 / 359
页数:5
相关论文
共 31 条
[1]   Silicon carbonitride: a rival to cubic boron nitride [J].
Badzian, A ;
Badzian, T ;
Drawl, WD ;
Roy, R .
DIAMOND AND RELATED MATERIALS, 1998, 7 (10) :1519-1525
[2]   Structural characterization of amorphous SiCxNy chemical vapor deposited coatings [J].
Bendeddouche, A ;
Berjoan, R ;
Beche, E ;
MerleMejean, T ;
Schamm, S ;
Serin, V ;
Taillades, G ;
Pradel, A ;
Hillel, R .
JOURNAL OF APPLIED PHYSICS, 1997, 81 (09) :6147-6154
[3]   Hardness and stiffness of amorphous SiCxNy chemical vapor deposited coatings [J].
Bendeddouche, A ;
Berjoan, R ;
Bêche, E ;
Hillel, R .
SURFACE & COATINGS TECHNOLOGY, 1999, 111 (2-3) :184-190
[4]  
BERGER C, 2003, CHEM VAPOR DEPOS, V1, P646
[5]   Wide band gap silicon carbon nitride films deposited by electron cyclotron resonance plasma chemical vapor deposition [J].
Chen, KH ;
Wu, JJ ;
Wen, CY ;
Chen, LC ;
Fan, CW ;
Kuo, PF ;
Chen, YF ;
Huang, YS .
THIN SOLID FILMS, 1999, 355 :205-209
[6]   Crystalline SiCN: a hard material rivals to cubic BN [J].
Chen, LC ;
Chen, KH ;
Wei, SL ;
Kichambare, PD ;
Wu, JJ ;
Lu, TR ;
Kuo, CT .
THIN SOLID FILMS, 1999, 355 :112-116
[7]   Surface tension studies of (Si, N)-containing diamond-like carbon films deposited by hexamethyldisilazane [J].
Chen, LY ;
Hong, FCN .
DIAMOND AND RELATED MATERIALS, 2003, 12 (3-7) :968-973
[8]   Progress in silicon-based non-oxide structural ceramics [J].
Dressler, W ;
Riedel, R .
INTERNATIONAL JOURNAL OF REFRACTORY METALS & HARD MATERIALS, 1997, 15 (1-3) :13-47
[9]   Synthesis of nanocrystalline silicon carbonitride films by remote plasma enhanced chemical vapor deposition using the mixture of hexamethyldisilazane with helium and ammonia [J].
Fainer, NI ;
Rumyantsev, YM ;
Golubenko, AN ;
Kosinova, ML ;
Kuznetsov, FA .
JOURNAL OF CRYSTAL GROWTH, 2003, 248 :175-179
[10]   Tribological and mechanical properties of CNx- and SiCNx-TiN/Ti multilayered systems grown onto steel [J].
Fernández-Ramos, C ;
Sánchez-López, JC ;
Belin, M ;
Donnet, C ;
Pascaretti, F ;
Fernández, A .
VACUUM, 2002, 67 (3-4) :551-558