Cationization of dendritic macromolecule adsorbates on metals studied by time-of-flight secondary ion mass spectrometry

被引:7
作者
Coullerez, G
Mathieu, HJ [1 ]
Lundmark, S
Malkoch, M
Magnusson, H
Hult, A
机构
[1] Swiss Fed Inst Technol, LMCH, Surface Anal Mat Inst, CH-1015 Lausanne, Switzerland
[2] Perstop Special Chem AB, SE-28480 Perstorp, Sweden
[3] Royal Inst Technol, Dept Polymer Technol, SE-10044 Stockholm, Sweden
关键词
ToF-SIMS; dendritic polymers; cationization; molecular weight; polyester; polyether;
D O I
10.1002/sia.1591
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was utilized to study dendritic macromolecules with various architectures, such as dendrons, dendrimers and hyperbranched polyesters prepared from bis-(hydroxymethyl)propionic acid (Bis-MPA) and a series of hyperbranched polyethers based on 3-ethyl-3(hydroxymethyl)oxetane. The measurements were performed on spin-coated thin films of the branched molecules (D) onto silicon, chemically etched copper foil and silver-coated wafers. They showed weak signatures of molecular ions by proton capture (D + H)(+) in the high mass range of the spectra (m/z > 400). On the contrary, cationization of the intact molecules with alkali or transition metal ions such as Na+, Cu+ or Ag+ was observed. High-intensity quasi-molecular ions (D + M)(+) (with M = Na+, Cu+ or Ag+) allowed the studied polymers to be identified. The whole molecular species were observed for Bis-MPA dendrons and dendrimers up to 3000 Da for hydroxyl or acetonide-terminated derivatives. The success of the so-called cationization experiments with metal substrates compared with analysis of molecular adsorbates on silicon is highlighted. The ToF-SIMS sensitivity appeared useful to provide information about the molecular end-groups or to highlight incomplete reaction occurring during some deprotection step of the synthesis. Only uncationized fragments of low masses were detected for the hyperbranched polyesters. This result suggested the effect of molecular asymmetry and/or flattening of the molecules on the substrates, which hampered the molecule lift-off efficiency. Nevertheless, the hyperbranched polyethers were characterized based on the peak distribution of intensities, which allowed estimation of their molecular weight average. This work was intended to illustrate the capabilities of ToF-SIMS to analyse dendritic polymers on surfaces. Copyright (C) 2003 John Wiley Sons, Ltd.
引用
收藏
页码:682 / 692
页数:11
相关论文
共 55 条
[1]   END-FUNCTIONALIZED POLYMERS .2. QUANTIFICATION OF FUNCTIONALIZATION BY TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY [J].
BELU, AM ;
HUNT, MO ;
DESIMONE, JM ;
LINTON, RW .
MACROMOLECULES, 1994, 27 (07) :1905-1910
[2]   SURFACE-ANALYSIS BY SECONDARY-ION MASS-SPECTROMETRY (SIMS) [J].
BENNINGHOVEN, A .
SURFACE SCIENCE, 1994, 299 (1-3) :246-260
[3]   DETECTION OF PHENYLTHIOHYDANTOIN DERIVATIVES OF AMINO-ACIDS BY SIMS [J].
BENNINGHOVEN, A ;
ANDERS, V .
ORGANIC MASS SPECTROMETRY, 1984, 19 (07) :345-346
[4]   SECONDARY ION MASS-SPECTROMETRY OF BIOMOLECULES IN THE PICO-MOL AND FEMTO-MOL RANGE [J].
BENNINGHOVEN, A ;
NIEHUIS, E ;
FRIESE, T ;
GREIFENDORF, D ;
STEFFENS, P .
ORGANIC MASS SPECTROMETRY, 1984, 19 (07) :346-346
[5]  
Benninghoven A., 1987, SECONDARY ION MASS S
[6]   TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY OF POLYMERS IN THE MASS RANGE 500-10000 [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
BENNINGHOVEN, A .
MACROMOLECULES, 1987, 20 (02) :407-413
[7]   MOLECULAR-WEIGHT DISTRIBUTIONS OF POLYMERS USING TIME-OF-FLIGHT SECONDARY-ION MASS-SPECTROMETRY [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
HAGENHOFF, B ;
NIEHUIS, E ;
BENNINGHOVEN, A .
ANALYTICAL CHEMISTRY, 1991, 63 (18) :1953-1960
[8]   STRUCTURAL CHARACTERIZATION OF MODEL POLYURETHANES USING TIME-OF-FLIGHT SECONDARY ION MASS-SPECTROMETRY [J].
BLETSOS, IV ;
HERCULES, DM ;
VANLEYEN, D ;
BENNINGHOVEN, A ;
KARAKATSANIS, CG ;
RIECK, JN .
ANALYTICAL CHEMISTRY, 1989, 61 (19) :2142-2149
[9]   Cationization effect on the molecular weight distribution of an ethoxylated polymer: A combined theoretical and time-of-flight secondary ion mass spectroscopic study [J].
Cheng, HS ;
Clark, PAC ;
Hanton, SD ;
Kung, P .
JOURNAL OF PHYSICAL CHEMISTRY A, 2000, 104 (12) :2641-2647
[10]   HIGH-RESOLUTION TOF-SIMS STUDIES OF SUBSTITUTED POLYSTYRENES [J].
CHIARELLI, MP ;
PROCTOR, A ;
BLETSOS, IV ;
HERCULES, DM ;
FELD, H ;
LEUTE, A ;
BENNINGHOVEN, A .
MACROMOLECULES, 1992, 25 (25) :6970-6976