共 7 条
[1]
AESCHIMANN L, 2006, INT C NANOSCIENCE TE
[2]
Integrated atomic force microscopy array probe with metal-oxide-semiconductor field effect transistor stress sensor, thermal bimorph actuator, and on-chip complementary metal-oxide-semiconductor electronics
[J].
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B,
2000, 18 (06)
:2669-2675
[3]
Kim MS, 2005, IEEE/LEOS Optical MEMs 2005: International Conference on Optical MEMs and Their Applications, P173
[4]
MANZARDO O, 2006, INT C NANOSCIENCE TE
[6]
POLESELMARIS J, 2006, INT C NANOSCIENCE TE