Concept and demonstration of individual probe actuation in two-dimensional parallel atomic force microscope system

被引:4
作者
Akiyama, Terunobu
Aeschimann, Laure
Chantada, Laura
De Rood, Nico. F.
Heinzelmann, Harry
Herzig, Hans P.
Manzardo, Omar
Meister, Andre
Polesel-Maris, Jerome
Pugin, Raphael
Staufer, Urs
Vettiger, Peter
机构
[1] Univ Neuchatel, SAMLAB, Inst Microtechnol, CH-2002 Neuchatel, Switzerland
[2] Univ Santiago de Compostela, Santiago De Compostela, Spain
[3] Univ Neuchatel, Inst Microtechnol, OPTICS, CH-2000 Neuchatel, Switzerland
[4] Swiss Ctr Elect & Microtechnol CSEM SA, CH-2002 Neuchatel, Switzerland
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2007年 / 46卷 / 9B期
关键词
SPM; AFM; probe array; actuator; optical heterodyne interferometry;
D O I
10.1143/JJAP.46.6458
中图分类号
O59 [应用物理学];
学科分类号
摘要
A concept of an array actuator that is used to control the tip-sample separation of cantilevers in a two-dimensional (21)) probe at-fay scanning system is proposed in this article. The feasibility of the concept is demonstrated with a 10 x 10 array actuator with 500 pm xy-pitches. The array actuator is made by slicing a bulk piezoceramic block. The obtained maximum actuation of a single probe was 2.19 mu m(p-p) at +/- 168 Vp-p. A major issue for the actuator was the insufficient strength of the frame of the probe array chip. The demonstrated array actuator is highly compatible with previously developed parallel readout modules that use either a parallel optical beam or integrated piezoresistive deflection sensing. A large-scale 2D probe array is our ultimate target.
引用
收藏
页码:6458 / 6462
页数:5
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