Exact scaling in competitive growth models

被引:21
作者
Braunstein, LA
Lam, CH
机构
[1] Univ Mar del Plata, Fac Ciencias Exactas & Nat, Dept Fis, RA-7600 Mar Del Plata, Argentina
[2] Hong Kong Polytech Univ, Dept Appl Phys, Hong Kong, Hong Kong, Peoples R China
[3] Boston Univ, Ctr Polymer Studies, Boston, MA 02215 USA
[4] Boston Univ, Dept Phys, Boston, MA 02215 USA
来源
PHYSICAL REVIEW E | 2005年 / 72卷 / 02期
关键词
D O I
10.1103/PhysRevE.72.026128
中图分类号
O35 [流体力学]; O53 [等离子体物理学];
学科分类号
070204 [等离子体物理]; 080103 [流体力学]; 080704 [流体机械及工程];
摘要
A competitive growth model (CGM) describes the aggregation of a single type of particle under two different growth rules with occurrence probabilities p and 1-p. We explain the origin of the scaling behavior of the resulting surface roughness at small p for two CGM's which describe random deposition (RD) competing with ballistic deposition and RD competing with the Edward-Wilkinson (EW) growth rule. Exact scaling exponents are derived. The scaling behavior of the coefficients in the corresponding continuum equations are also deduced. Furthermore, we suggest that, in some CGM's, the p dependence on the coefficients of the continuum equation that represents their universality class can be nontrivial. In some cases, the process cannot be represented by a unique universality class. In order to show this, we introduce a CGM describing RD competing with a constrained EW model. This CGM shows a transition in the scaling exponents from RD to a Kardar-Parisi-Zhang behavior when p is close to 0 and to a Edward-Wilkinson one when p is close to 1 at practical time and length scales. Our simulation results are in excellent agreement with the analytic predictions.
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页数:5
相关论文
共 19 条
[1]
Three-dimensional off-lattice model for the interface growth of polycrystalline materials [J].
Albano, EV ;
Salvarezza, RC ;
Vázquez, L ;
Arvia, AJ .
PHYSICAL REVIEW B, 1999, 59 (11) :7354-7357
[2]
Barabasi A.-L., 1995, FRACTAL CONCEPTS SUR, DOI [10.1017/CBO9780511599798, DOI 10.1017/CBO9780511599798]
[3]
Roughening, deroughening, and nonuniversal scaling of the interface width in electrophoretic deposition of polymer chains [J].
Bentrem, FW ;
Pandey, RB ;
Family, F .
PHYSICAL REVIEW E, 2000, 62 (01) :914-917
[4]
Braunstein LA, 2002, PHYS REV E, V65, DOI 10.1103/PhysRevE.65.056128
[5]
Crossover effects in a discrete deposition model with Kardar-Parisi-Zhang scaling [J].
Chame, A ;
Reis, FDAA .
PHYSICAL REVIEW E, 2002, 66 (05) :6
[6]
Forest fires and other examples of self-organized criticality [J].
Clar, S ;
Drossel, B ;
Schwabl, F .
JOURNAL OF PHYSICS-CONDENSED MATTER, 1996, 8 (37) :6803-6824
[7]
SCALING OF ROUGH SURFACES - EFFECTS OF SURFACE-DIFFUSION [J].
FAMILY, F .
JOURNAL OF PHYSICS A-MATHEMATICAL AND GENERAL, 1986, 19 (08) :L441-L446
[8]
Electrophoretic deposition of polymer chains on an adsorbing surface in (2+1) dimensions: Conformational anisotropy and nonuniversal coverage [J].
Foo, GM ;
Pandey, RB .
PHYSICAL REVIEW LETTERS, 1998, 80 (17) :3767-3770
[9]
Interface roughening in Hele-Shaw flows with quenched disorder:: Experimental and theoretical results [J].
Hernández-Machado, A ;
Soriano, J ;
Lacasta, AM ;
Rodríguez, MA ;
Ramírez-Piscina, L ;
Ortín, J .
EUROPHYSICS LETTERS, 2001, 55 (02) :194-200
[10]
Horowitz CM, 2001, PHYS REV E, V63, DOI 10.1103/PhysRevE.63.066132