Visualization by near-field microscopy of the impacts of swift heavy ions in amorphous metallic alloys

被引:17
作者
Audouard, A
Mamy, R
Toulemonde, M
Szenes, G
Thomé, L
机构
[1] Ctr Spectrometrie Nucl & Spectrometrie Masse, CNRS, IN2P3, F-91405 Orsay, France
[2] Inst Natl Sci Appl, SNCMP, Phys Mat Condensee Lab, CNRS,UMR 5830, F-31077 Toulouse, France
[3] Ctr Interdisciplinaire Rech Ions Lourds, Lab Commun, CEA, CNRS, F-14040 Caen 5, France
[4] Eotvos Lorand Univ, Inst Gen Phys, H-1088 Budapest, Hungary
[5] Ctr Spectrometrie Nucl & Spectrometrie Masse, CNRS, IN2P3, F-91405 Orsay, France
关键词
D O I
10.1016/S0168-583X(98)00468-6
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The surface of amorphous metallic ribbons (Fe(81)B(13.5)Si(3.5)C(2)) irradiated with swift heavy ions is studied by atomic force microscopy (AFM). Ion impacts are materialized by the formation of hillocks for irradiations at 300 K with a high (dE/dx)(e) (above similar to 55 keV nm(-1)). The height of the hillocks strongly decreases when the samples are aged during 1 year at room temperature. Conversely, irradiation at 80 K does not induce noticeable modifications of the surface of the ribbons. The results indicate that the formation of the hillocks, which are flattened by the sample growth, is essentially due to the damage created by electronic excitation in individual ion tracks. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:217 / 221
页数:5
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