X-ray diffraction studies of epitaxial Pb(Zr,Ti)O3 films prepared by chemical solution method

被引：4

作者：

Hwang, KS ^{[1
]}

Kim, BH ^{[1
]}

机构：

[1] Chonnam Natl Univ, Dept Ceram Engn, Kwangju 500757, South Korea

来源：

MATERIALS CHEMISTRY AND PHYSICS | 1999年 / 57卷 / 03期

关键词：

Pb(Zr; Ti)O-3; reciprocal-space map; tetragonal phase;

D O I：

10.1016/S0254-0584(98)00223-5

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In this study, epitaxial Pb(Zr,Ti)O-3 thin films prepared on various substrates by dipping-pyrolysis process were investigated using asymmetric X-ray diffraction 2 theta/omega scans. Epitaxially grown films heat-treated at 750 degrees C on Nb-doped SrTiO3(100) and LaAlO3(100) were found by reciprocal-space map analysis to consist of the c-axis-oriented tetragonal phase. (C) 1999 Elsevier Science S.A. All rights reserved.

引用

页码：224 / 227

页数：4

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