A horizontal two-axis diffractometer for high-energy X-ray diffraction using synchrotron radiation on bending magnet beamline BL04B2 at SPring-8

被引:139
作者
Kohara, S [1 ]
Suzuya, K
Kashihara, Y
Matsumoto, N
Umesaki, N
Sakai, I
机构
[1] Japan Synchrotron Radiat Res Inst, Expt Res Div, Mikazuki, Hyogo 6795198, Japan
[2] Japan Atom Energy Res Inst, Mikazuki, Hyogo 6795143, Japan
[3] Osaka Natl Res Inst, Dept Opt Mat, Ikeda, Osaka 5638577, Japan
[4] Ritsumeikan Univ, Fac Sci & Engn, Dept Photon, Shiga 5258577, Japan
关键词
high-energy X-ray; X-ray diffraction;
D O I
10.1016/S0168-9002(01)00630-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A horizontal two-axis diffractometer for glasses and liquids, installed at SPring-8 bending magnet beamline BL04B2, operated at 8 GeV electron energy, is described. Photon energies of 37.8 and 61.7 keV were obtained using a bent Si (1 1 1) crystal and a bent Si (2 2 0) crystal, respectively. The instrument has been successfully applied to measure diffraction spectra of vitreous SiO2 in transmission geometry up to scattering vector Q = 36 Angstrom (-1), and measured total structure factor S(Q) was well reproduced by reverse Monte Carlo modelling. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:1030 / 1033
页数:4
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