Nanostructured diffractive optical devices for soft X-ray microscopes

被引:7
作者
Hambach, D
Peuker, M
Schneider, G
机构
[1] Univ Gottingen, Inst Xray Phys, D-37073 Gottingen, Germany
[2] Lawrence Berkeley Natl Lab, Ctr Xray Opt, Berkeley, CA 94720 USA
关键词
X-ray microscopy; zone plate; electroplating; nickel; diffraction efficiency; resolution;
D O I
10.1016/S0168-9002(01)00507-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The new transmission X-ray microscope (TXM) installed at the BESSY II electron storage ring uses an off-axis transmission zone plate (OTZ) as diffractive and focusing element of the condenser-monochromator setup. A high resolution micro-zone plate (MZP) forms a magnified image on a CCD-detector. Both, the OTZ with an active area of up to 24 mm(2) and the MZP with zone widths as small as 25 nm are generated by a process including electron beam lithography (EBL), dry etching and subsequent electroplating of nickel on top of silicon membrane substrates with about 100-150 nm thickness. The combination of a larger zone width and the usage of nickel zone structures allows to increase the diffraction efficiency of the condenser element at least by a factor of 3 compared to the earlier used KZP7 condenser zone plate in the TXM at BESSY I. Groove diffraction efficiencies of 21.6% and 14.7% were measured for MZP objectives with 40 and 25 nm outermost zone width, respectively. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:877 / 880
页数:4
相关论文
共 8 条
[1]   Line width control using a defocused low voltage electron beam [J].
David, C ;
Hambach, D .
MICROELECTRONIC ENGINEERING, 1999, 46 (1-4) :219-222
[2]  
Guttmann P, 2000, AIP CONF PROC, V507, P411, DOI 10.1063/1.1291181
[3]  
Niemann B, 2000, AIP CONF PROC, V507, P440, DOI 10.1063/1.1291187
[4]  
NIEMANN B, 1998, XRAY MICROSCOPY, V5, P4
[5]  
Peuker M, 2000, AIP CONF PROC, V507, P682, DOI 10.1063/1.1291232
[6]  
REYNOLDS, 1990, NEW PHYSICAL OPTICS, P536
[7]   Cross-linked polymers for nanofabrication of high-resolution zone plates in nickel and germanium [J].
Schneider, G ;
Schliebe, T ;
Aschoff, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06) :2809-2812
[8]   Radiation-enhanced network formation in copolymer galvanoforms for diffractive nickel x-ray optics with high aspect ratios [J].
Weiss, D ;
Peuker, M ;
Schneider, G .
APPLIED PHYSICS LETTERS, 1998, 72 (15) :1805-1807