A microstructural study of PtCo thin films

被引:5
作者
Casey, S [1 ]
Hill, E [1 ]
Miles, J [1 ]
Sivasamy, P [1 ]
Birtwistle, K [1 ]
Middleton, B [1 ]
Chapman, J [1 ]
Rose, J [1 ]
机构
[1] UNIV GLASGOW,DEPT PHYS & ASTRON,GLASGOW,LANARK,SCOTLAND
关键词
D O I
10.1109/20.539187
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
PtxCo(1-x) thin films where 0.15 less than or equal to x less than or equal to 0.35 have a potential use in ultra high density longitudinal recording and have been studied using various TEM techniques. The thin films have been deposited onto glass, Si/Si3N4 and Si3N4 windowed substrates. It was found that the microstructure, crystallography and magnetic properties varied a great deal depending on which substrate the films were deposited onto.
引用
收藏
页码:3831 / 3833
页数:3
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