Three-dimensional resolution enhancement in fluorescence microscopy by harmonic excitation

被引：42

作者：

Frohn, JT ^{[1
]}

Knapp, HF ^{[1
]}

Stemmer, A ^{[1
]}

机构：

[1] Swiss Fed Inst Technol, Nanotechnol Grp, CH-8092 Zurich, Switzerland

来源：

OPTICS LETTERS | 2001年 / 26卷 / 11期

关键词：

D O I：

10.1364/OL.26.000828

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A method for increasing lateral as well as axial resolution in fluorescence microscopy is presented. A pass-band with a high cutoff frequency throughout reciprocal space can be achieved by illumination of the object with spatially harmonic excitation patterns generated by the interference of two collimated laser beams. Theoretical calculations show an almost isotropic point-spread function with a FWHM near 100 nm. (C) 2001 Optical Society of America.

引用

页码：828 / 830

页数：3

共 9 条

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