Dielectric characterization of low-loss materials - A comparison of techniques

被引：148

作者：

Baker-Jarvis, J ^{[1
]}

Geyer, RG

Grosvenor, JH

Janezic, MD

Jones, CA

Riddle, B

Weil, CM

Krupka, J

机构：

[1] Natl Inst Stand & Technol, Div Electromagnet Fields, Boulder, CO 80303 USA

[2] Warsaw Univ Technol, PL-00661 Warsaw, Poland

来源：

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 1998年 / 5卷 / 04期

关键词：

D O I：

10.1109/94.708274

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Measurements on low-loss materials using closed and open cavity resonators, and dielectric resonator methods are presented. Results indicate that consistent measurement results can be obtained with a number of well-characterized fixtures. Uncertainties associated with each method are addressed. Measurements also were performed an materials used in previous intercomparisons.

引用

页码：571 / 577

页数：7

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