Comparing the resolution of magnetic force microscopes using the CAMST reference samples

被引：40

作者：

Abelmann, L

Porthun, S

Haast, M

Lodder, C

Moser, A

Best, ME

van Schendel, PJA

Stiefel, B

Hug, HJ

Heydon, GP

Farley, A

Hoon, SR

Pfaffelhuber, T

Proksch, R

Babcock, K

机构：

[1] Univ Twente, MESA Res Inst, NL-7500 AE Enschede, Netherlands

[2] Univ Basel, Inst Phys, Basel, Switzerland

[3] Manchester Metropolitan Univ, Sch Phys, Manchester M15 6BH, Lancs, England

[4] IBM Corp, Almaden Res Ctr, San Jose, CA USA

[5] Univ Regensburg, Dept Appl Phys, D-8400 Regensburg, Germany

[6] Digital Instruments, Santa Barbara, CA USA

来源：

JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS | 1998年 / 190卷 / 1-2期

关键词：

magnetic force microscopy; resolution; Fourier analysis; low temperature; vacuum; magneto-optic;

D O I：

10.1016/S0304-8853(98)00281-9

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

A set of reference samples for comparing the results obtained with different magnetic force microscopes (MFM) has been prepared. These samples consist of CoNi/Pt magneto-optic multilayers with different thicknesses. The magnetic properties of the multilayer are tailored in such a way that a very fine stripe domain structure occurs in remanence. On top of this intrinsic domain structure, bits were written thermomagnetically using different laser powers. These samples have been imaged in six different laboratories employing both home-built and commercial magnetic force microscopes, The resolution obtained with these different microscopes, tips and measurement methods varies between 30 and 100 nm. (C) 1998 Elsevier Science B.V. All rights reserved.

引用

页码：135 / 147

页数：13

共 15 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY
ALBRECHT, TR
GRUTTER, P
HORNE, D
RUGAR, D
[J]. JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) : 668 - 673
[2] Cullity B.D., 1972, Introduction to Magnetic Materials
[3] DEBOEF AJ, 1991, THESIS U TWENTE
[4] DEBOEF AJ, 1989, APPL PHYS LETT, V55, P439
[5] HUG HJ, UNPUB
[6] HUG HJ, IN PRESS J APPL PHYS
[7] MENG Q, 1996, J MAGN SOC JAPAN, V20, P53
[8] A MINIATURE FIBER OPTIC FORCE MICROSCOPE SCAN HEAD
MOSER, A
HUG, HJ
JUNG, T
SCHWARZ, UD
GUNTHERODT, HJ
[J]. MEASUREMENT SCIENCE AND TECHNOLOGY, 1993, 4 (07) : 769 - 775
[9] Magnetic force microscopy of thin film media for high density magnetic recording
Porthun, S
Abelmann, L
Lodder, C
[J]. JOURNAL OF MAGNETISM AND MAGNETIC MATERIALS, 1998, 182 (1-2) : 238 - 273
[10] PORTHUN S, IN PRESS J APPL PHYS

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