Filtered x-ray diode diagnostics fielded on the Z accelerator for source power measurements

被引：80

作者：

Chandler, GA

Deeney, C

Cuneo, M

Fehl, DL

McGurn, JS

Spielman, RB

Torres, JA

McKenney, JL

Mills, J

Struve, KW

机构：

[1] Sandia Natl Labs, Albuquerque, NM 87185 USA

[2] KTECH Corp, Albuquerque, NM USA

[3] Mission Res Corp, Albuquerque, NM 87106 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 1999年 / 70卷 / 01期

关键词：

D O I：

10.1063/1.1149355

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

Filtered x-ray diode (XRD) detectors are used as primary radiation flux diagnostics on Sandia's Z accelerator, which generates nominally a 200-TW, 2-MJ, x-ray pulse. Given such flux levels and XRD sensitivities the detectors are being fielded 23 m from the source. The standard diagnostic setup and sensitivities are discussed. Vitreous carbon photocathodes are being used to reduce the effect of hydrocarbon contamination present in the Z-machine vacuum system. Nevertheless pre- and postcalibration data taken indicate spectrally dependent changes in the sensitivity of these detectors by up to factors of 2 or 3. (C) 1999 American Institute of Physics. [S0034-6748(99)70401-6].

引用

页码：561 / 565

页数：5

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