Magnetoresistance of Ni/NiO/Co small tunnel junctions in Coulomb blockade regime

被引:85
作者
Ono, K [1 ]
Shimada, H [1 ]
Kobayashi, S [1 ]
Ootuka, Y [1 ]
机构
[1] UNIV TOKYO, FAC SCI, DEPT PHYS, BUNKYO KU, TOKYO 113, JAPAN
关键词
Coulomb blockade; spin-polarized transport; tunnel junction; ferromagnet; single electron charging effect; magnetoresistance;
D O I
10.1143/JPSJ.65.3449
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We report experimental results on the arrays of small (< 0.01 mu m(2)) Ni/NiO/Co tunnel junctions. At high temperatures or high bias conditions, we observed magnetoresistance due to changes in the relative orientation of magnetization of the electrodes. In the Coulomb blockade regime, magnetoresistance is bias-dependent and a large negative magnetoresistance of up to 40% was observed.
引用
收藏
页码:3449 / 3451
页数:3
相关论文
共 12 条
[1]   TUNNEL-TYPE GMR IN METAL-NONMETAL GRANULAR ALLOY THIN-FILMS [J].
FUJIMORI, H ;
MITANI, S ;
OHNUMA, S .
MATERIALS SCIENCE AND ENGINEERING B-SOLID STATE MATERIALS FOR ADVANCED TECHNOLOGY, 1995, 31 (1-2) :219-223
[2]   Giant magnetoresistance in granular Fe-MgF2 films [J].
Furubayashi, T ;
Nakatani, I .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) :6258-6260
[3]  
Grabert H., 1992, Single Charge Tunneling
[4]   TUNNELING BETWEEN FERROMAGNETIC-FILMS [J].
JULLIERE, M .
PHYSICS LETTERS A, 1975, 54 (03) :225-226
[5]   ELECTRON-TUNNELING BETWEEN FERROMAGNETIC-FILMS [J].
MAEKAWA, S ;
GAFVERT, U .
IEEE TRANSACTIONS ON MAGNETICS, 1982, 18 (02) :707-708
[6]  
MESERVEY R, 1994, PHYS REP, V238, P174
[7]  
MIYAZAKI T, 1995, J MAGN MAGN MATER, V139, pL231, DOI 10.1016/0304-8853(94)01648-8
[8]  
MIYAZAKI T, 1996, J APPL PHYS, V79, P6262
[9]   Ferromagnetic-insulator-ferromagnetic tunneling: Spin-dependent tunneling and large magnetoresistance in trilayer junctions [J].
Moodera, JS ;
Kinder, LR .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (08) :4724-4729
[10]   LARGE MAGNETORESISTANCE AT ROOM-TEMPERATURE IN FERROMAGNETIC THIN-FILM TUNNEL-JUNCTIONS [J].
MOODERA, JS ;
KINDER, LR ;
WONG, TM ;
MESERVEY, R .
PHYSICAL REVIEW LETTERS, 1995, 74 (16) :3273-3276