Surface roughness characterisation of multilayer polymer films for graphic arts applications

被引:17
作者
Larena, A
Millán, F
Verdú, M
Pinto, G
机构
[1] Univ Politecn Madrid, Dept Ingn Quim Ind & Medio Ambiente, ETSI Ind, E-28006 Madrid, Spain
[2] Univ Complutense Madrid, Dept Opt, E-28040 Madrid, Spain
[3] CIDA, Madrid 28033, Spain
关键词
surface roughness; optical reflectance; multilayer polymer films; graphic arts;
D O I
10.1016/S0169-4332(01)00179-9
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The paper contains an experimental study about the relationship between surface roughness of films for graphic arts applications, measured by means of average roughness and peak count, and reflectometer measurements by using different incidence angles of light. Samples studied were multilayer materials for graphic arts, obtained by spreading adherent emulsion layers over both sides of a substrate of polyethyleneterephtalate (PET) film. Different surface roughness were obtained by spreading a protective coating with different amounts of matizant agent (emulsion of gelatine and polymeric spheres of 3 +/- 1 mum of diameter). Good correlations between reflectometer measurements and surface roughness were found, showing that this optical technique is potentially a good way to study the surface characteristics of these materials. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:217 / 224
页数:8
相关论文
共 13 条
[1]   RECENT DEVELOPMENTS IN SURFACE-ROUGHNESS CHARACTERIZATION [J].
BENNETT, JM .
MEASUREMENT SCIENCE AND TECHNOLOGY, 1992, 3 (12) :1119-1127
[2]   Effect of indium tin oxide substrate roughness on the morphology, structural and optical properties of CdS thin films [J].
Castro-Rodríguez, R ;
Oliva, AI ;
Sosa, V ;
Caballero-Briones, F ;
Peña, JL .
APPLIED SURFACE SCIENCE, 2000, 161 (3-4) :340-346
[3]   SURFACE-ROUGHNESS OF POROUS MATERIALS AND ITS CHARACTERIZATION BY X-RAY ABSORPTION-MEASUREMENTS [J].
HERMANN, H ;
PITSCHKE, W ;
MATTERN, N .
PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 1992, 132 (01) :103-114
[4]   CONSIDERATIONS OF SURFACE-STRUCTURE CHARACTERIZATION FOR POLYETHYLENE FILMS BY REFLECTOMETRY [J].
LARENA, A ;
PINTO, G .
MATERIALS LETTERS, 1990, 10 (03) :136-138
[5]   ANALYSIS OF THE RELATIONSHIP BETWEEN SURFACE-ROUGHNESS AND REFLECTOMETRICAL MEASUREMENT OF POLYETHYLENE FILMS [J].
LARENA, A ;
PINTO, G .
MATERIALS LETTERS, 1991, 11 (8-9) :309-311
[6]   GENERALIZED MATRIX-METHOD FOR ANALYSIS OF COHERENT AND INCOHERENT REFLECTANCE AND TRANSMITTANCE OF MULTILAYER STRUCTURES WITH ROUGH SURFACES, INTERFACES, AND FINITE SUBSTRATES [J].
MITSAS, CL ;
SIAPKAS, DI .
APPLIED OPTICS, 1995, 34 (10) :1678-1683
[7]   A COMPLETE DESCRIPTION OF SURFACE TEXTURE PROFILES [J].
MULVANEY, DJ ;
NEWLAND, DE ;
GILL, KF .
WEAR, 1989, 132 (01) :173-182
[8]  
Scherrer G.W, 1990, DRYING SOL GEL SCI
[9]  
Shackelford JF., 1996, INTRO MAT SCI ENG
[10]   Studies of optical haze and surface morphology of blown polyethylene films using atomic force microscopy [J].
Smith, PF ;
Chun, I ;
Liu, G ;
Dimitrievich, D ;
Rasburn, J ;
Vancso, GJ .
POLYMER ENGINEERING AND SCIENCE, 1996, 36 (16) :2129-2134