Characterization of ternary and quaternary zirconias by XRD and EXAFS: result comparison and data modeling

被引：18

作者：

Degueldre, C ^{[1
]}

Conradson, S

机构：

[1] Paul Scherrer Inst, LWV, CH-5232 Villigen, Switzerland

[2] Los Alamos Natl Lab, MST 11, Los Alamos, NM 87545 USA

来源：

APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2001年 / 73卷 / 04期

关键词：

Crystallography - Erbium compounds - Lattice constants - Neutron scattering - Solid solutions - X ray diffraction analysis - X ray spectroscopy;

D O I：

10.1007/s003390100798

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray diffraction (XRD) data and extended X-ray absorption fine-structure spectroscopy (EXAFS) data are compared far a zirconia-based solid solution such as ternary Er0.05Y0.10Zr0.85O1.925 (inert matrix) and quaternary Er0.05Y0.10Ce0.10Zr0.75O1.925 (simulated inert matrix fuel where Ce is used instead of Pu). Average distances between the ions: metal-oxygen and metal-metal (for the 8 first shells of the cations) obtained by EXAFS are compared with values derived from the lattice parameter gained by XRD using a crystallographic formula derived far the fluorite-type solid solution. Data agreement makes comparison between atomic and crystallographic features very valuable for the characterization of these zirconia-based solid solutions (inert matrix fuel). The effect of the cation size of the dopants on the expansion of the crystallographic lattice is modeled and formal quantification of the lattice-parameter expansion as a function of ceria addition is derived.

引用

页码：489 / 494

页数：6

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