Parity effect in a superconducting single-electron transistor with a 20-nm island

被引:5
作者
Nakamura, Y
Chen, CD
Tsai, JS
机构
[1] NEC Fundamental Research Laboratories, Tsukuba, Ibaraki 305
关键词
D O I
10.1007/BF02548150
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
With a, specially-designed three-angle shadow evaporation, we fabricated an Al-based single-electron transistor with a 20-nm island. We investigated electron transport through the single-electron transistor in the superconducting state as a function of the source-drain voltage as well as the gate voltage. 2e-periodic small current plateaus appeared. We attribute the origin of this structure to the odd number states of electrons in the island. Compared with a theoretical calculation, it showed a reasonable agreement at low temperatures and low source-drain voltages, while at higher voltages the parity effect diminished.
引用
收藏
页码:3339 / 3344
页数:6
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