A straightforward method to extract the shunt resistance of photovoltaic cells from current-voltage characteristics of mounted arrays

被引：35

作者：

d'Alessandro, Vincenzo ^{[1
]}

Guerriero, Pierluigi ^{[1
]}

Daliento, Santolo ^{[1
]}

Gargiulo, Matteo ^{[1
]}

机构：

[1] Univ Naples Federico II, Dept Biomed Elect & Telecommun Engn, I-80125 Naples, Italy

来源：

SOLID-STATE ELECTRONICS | 2011年 / 63卷 / 01期

关键词：

Bypass diode; Five-parameter model; I-V characteristic; One-diode equivalent circuit; Photovoltaic (PV) cells; PV string; Series resistance; Shunt resistance; SERIES RESISTANCE; SOLAR-CELLS; PARAMETERS; MODEL; PERFORMANCE; DARK;

D O I：

10.1016/j.sse.2011.05.018

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A straightforward non-invasive method is proposed to accurately evaluate the shunt resistance of an elementary cell of a photovoltaic module connected in an installed string without requiring prior knowledge of the parameters of the intrinsic diodes. The approach relies on the measurement of the current-voltage characteristic of the whole string after intentionally shading the selected cell. Calibrated PSPICE simulations are employed to illustrate the method and test its reliability. As a case study, the shunt resistances of several cells belonging to a series array of 10 commercial panels are determined. (C) 2011 Elsevier Ltd. All rights reserved.

引用

页码：130 / 136

页数：7

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