Structural, ferroelectric and optical properties of PZT thin films

被引:95
作者
Pandey, SK [1 ]
James, AR [1 ]
Raman, R [1 ]
Chatterjee, SN [1 ]
Goyal, A [1 ]
Prakash, C [1 ]
Goel, TC [1 ]
机构
[1] Solid State Phys Lab, DRDO, Delhi 110054, India
关键词
PZT; thin films; sol-gel; optical measurements;
D O I
10.1016/j.physb.2005.08.024
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
We report on the structural, ferroelectric and optical properties of lead zirconate titanate (PZT) thin films (with a molar ratio of Zr:Ti::65:35) deposited by sol-gel technique on ITO-coated corning 7059 glass substrates. A seed layer of PbTiO3 (0.1 mu m) was coated by sol-gel on the substrates before depositing PZT. A metal/ferroelectric/metal (MFM) structure was used for electrical property measurements, formed by depositing gold electrodes on top of the film. The films were characterized for C-V, I-V, P-E and optical transmission. Relatively low remnant polarization (P-r = 3.6 mu C/cm(2)) was observed for the films. Value of optical band gap was found to be 3.4eV. The results are discussed. (c) 2005 Elsevier B.V. All rights reserved.
引用
收藏
页码:135 / 142
页数:8
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