Defect-dominated diameter dependence of fracture strength in single-crystalline ZnO nanowires: In situ experiments

被引：20

作者：

He, Mo-Rigen ^{[1
]}

Zhu, Jing ^{[1
]}

机构：

[1] Tsinghua Univ, Beijing Natl Ctr Electron Microscopy, Dept Mat Sci & Engn, Adv Mat Lab, Beijing 100084, Peoples R China

来源：

PHYSICAL REVIEW B | 2011年 / 83卷 / 16期

基金：

中国国家自然科学基金;

关键词：

MECHANICAL-PROPERTIES; PHOTOLUMINESCENCE; ARRAYS;

D O I：

10.1103/PhysRevB.83.161302

中图分类号：

T [工业技术];

学科分类号：

120111 [工业工程];

摘要：

Diameter (D) dependence of fracture strength in [0001]-oriented single-crystalline ZnO nanowires (NWs) with D ranging from 18 to 114 nm is experimentally revealed via in situ uniaxial tension. The lower bound of the scattered strengths increases with decreasing D, following a modified power law, and critical defects that effectively dominate the strengths are attributed to the diameter-dependent quantities of discrete point defects in NWs, based on in situ cathodoluminescence spectra. As a result, the size-effect mechanism of fracture strength is well understood, accounting for a simple and basic case of single-crystalline NWs.

引用

页数：4

共 27 条

[1]

Evolution of nanoscale defects to planar cracks in a brittle solid [J].