Degradation of solid dielectrics due to internal partial discharge: Some thoughts on progress made and where to go now

被引:215
作者
Morshuis, PHF [1 ]
机构
[1] Delft Univ Technol, NL-2628 CD Delft, Netherlands
关键词
partial discharges; internal PD; aging; dielectric breakdown; INSULATING MATERIALS; LIFETIME PREDICTION; EPOXY-RESIN; PD; NANOCOMPOSITES; TEMPERATURE; TRANSITION; MECHANISMS; CAVITIES; VOLTAGE;
D O I
10.1109/TDEI.2005.1522185
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
080906 [电磁信息功能材料与结构]; 082806 [农业信息与电气工程];
摘要
The amount of literature on partial discharge (PD) and partial discharge induced degradation is vast. In the past 10 - 20 years significant progress has been made on research within partial discharge induced aging of dielectrics. Researchers now agree on the main mechanisms pertaining to this topic. With the advent of a new generation of dielectrics of which many properties now can be affected by the introduction of small amounts of nano-sized particles it seems to be a good moment to review the progress on the understanding of PD induced aging. Focusing on internal partial discharge in solid polymeric insulation this paper tries to identify achievements and at the same time challenges still to be solved.
引用
收藏
页码:905 / 913
页数:9
相关论文
共 60 条
[1]
Treeing in mechanically pre-stressed electrical insulation [J].
Al-Ghamdi, SA ;
Varlow, BR .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2004, 11 (01) :130-135
[2]
AUCKLAND DW, 1993, 1993 ANN REP C EL IN, P636
[3]
Layered silicate nanocomposites based on various high-functionality epoxy resins: The influence of cure temperature on morphology, mechanical properties, and free volume [J].
Becker, O ;
Cheng, YB ;
Varley, RJ ;
Simon, GP .
MACROMOLECULES, 2003, 36 (05) :1616-1625
[4]
BELKACEMI NF, 1995, IEE P-SCI MEAS TECH, V142, P477
[5]
PD recurrence in cavities at different energizing methods [J].
Bodega, R ;
Morshuis, PHF ;
Lazzaroni, M ;
Wester, FJ .
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2004, 53 (02) :251-258
[6]
Bodega R, 2002, 2002 ANNUAL REPORT CONFERENCE ON ELECTRICAL INSULATION AND DIELECTRIC PHENOMENA, P685, DOI 10.1109/CEIDP.2002.1048889
[7]
A new methodology for the identification of PD in electrical apparatus: Properties and applications [J].
Cavallini, A ;
Montanari, GC ;
Puletti, F ;
Contin, A .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2005, 12 (02) :203-215
[8]
Champion JV, 2000, IEE CONF PUBL, P35, DOI 10.1049/cp:20000473
[9]
CHRISTENSEN S, 1985, THESIS TU DENMARK
[10]
DEJEAN P, 1992, PROCEEDINGS OF THE 4TH INTERNATIONAL CONFERENCE ON CONDUCTION AND BREAKDOWN IN SOLID DIELECTRICS, P181, DOI 10.1109/ICSD.1992.224985