Accuracy estimation of mixed-mode scattering parameter measurements

被引:36
作者
Bockelman, DE [1 ]
Eisenstadt, WR
Stengel, R
机构
[1] Motorola Inc, Radio Prod Appl Res, Plantation, FL 33322 USA
[2] Univ Florida, Gainesville, FL 32611 USA
关键词
calibration; measurement standards; networks;
D O I
10.1109/22.740089
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The pure-mode vector network analyzer (PMVNA) provides direct measurement of differential circuits. Residual error models are derived for the PMVNA and a traditional four-port vector network analyzer (FPVNA), The residual error models are used to calculate the maximum and root-mean-square uncertainties in measurements of mixed-mode scattering parameters of a typical differential amplifier. The uncertainties produced by the PMVNA are compared to the transformed mixed-mode s-parameters of the FPVNA, The PMVNA is shown to have lower uncertainty when measuring differential devices.
引用
收藏
页码:102 / 105
页数:4
相关论文
共 6 条
[1]   COMBINED DIFFERENTIAL AND COMMON-MODE SCATTERING PARAMETERS - THEORY AND SIMULATION [J].
BOCKELMAN, DE ;
EISENSTADT, WR .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1995, 43 (07) :1530-1539
[2]   Pure-mode network analyzer for on-wafer measurements of mixed-mode S-parameters of differential circuits [J].
Bockelman, DE ;
Eisenstadt, WR .
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, 1997, 45 (07) :1071-1077
[3]  
BOCKELMAN DE, UNPUB IEEE T MICROWA
[4]  
BOCKELMAN DE, 1997, THESIS U FLORIDA
[5]  
DONECKER B, 1984, HEWLETT PACK RF MICR, P4
[6]  
Wolfram, 2017, MATHEMATICA