The near-field super-resolution properties of an antimony thin film

被引：73

作者：

Tominaga, J

Fuji, H

Sato, A

Nakano, T

Fukaya, T

Atoda, N

机构：

[1] Natl Inst Adv Interdisciplinary Res, Adv Opt Memory Grp, Tsukuba, Ibaraki 3058562, Japan

[2] Sharp Co Ltd, AVC Res Lab, Tenri, Nara 6328567, Japan

[3] Minolta Co Ltd, Opt Technol Div, Takatsuki, Osaka 5698503, Japan

[4] Natl Inst Mat & Chem Res, Special Dept COE Project, Tsukuba, Ibaraki 3058565, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS | 1998年 / 37卷 / 11A期

关键词：

optical near-field; optical data storage; high density recording; phase change; Sb film;

D O I：

10.1143/JJAP.37.L1323

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A multilayered super-resolution near-field structure (Super-RENS) disk with the order of SiN/Sb/SiN/GeSbTe/SiN was produced on a polycarbonate substrate. The readout resolution properties of small phase change marks recorded through an antimony thin film were investigated. The linear and radial densities have been carefully examined, and it was found that the recorded phase change marks with a size of 0.15 mu m were mostly circle. Two different signal frequencies of 7.0 and 7.2 MHz were recorded on one land area between grooves for tracking by offsetting the tracking to the right and left from the center. The width of the land area was 0.6 mu m. The recording linear velocity was 3.0 mis. In the reading, both signals were detected at the center of the tracking. However, when the tracking was offset at the positions of +/-0.2 mu m from the center, each signal was clearly separated without crosstalk owing to an Sb Super-RENS.

引用

页码：L1323 / L1325

页数：3