A compact portable setup for in situ solar cells degradation

被引：7

作者：

Filevich, A ^{[1
]}

Bruno, CJ

Vázquez, JF

Alurralde, M

Prario, I

Tamasi, MJL

Bogado, MGM

Plá, JC

Durán, J

Schuff, J

Burlón, A

Stoliar, P

Minsky, D

Kreiner, AJ

Mayer, R

机构：

[1] CNEA, Dept Phys, Buenos Aires, DF, Argentina

[2] CNEA, Dept Mat Sci, Buenos Aires, DF, Argentina

[3] CNEA, CAB, San Carlos De Bariloche, Rio Negro, Argentina

来源：

IEEE TRANSACTIONS ON NUCLEAR SCIENCE | 2003年 / 50卷 / 06期

关键词：

electron radiation effects; photovoltaic cells; photovoltaic space power systems; proton radiation effects; test equipment;

D O I：

10.1109/TNS.2003.821580

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

We describe a new method for in situ study of solar cell degradation that accumulates the damage produced by several subsequent fluences of radiation on the same cell. We have used this method to obtain a full characterization of silicon cells after inducing radiation damage with 8-MeV and 10-MeV protons and with 2.65-MeV electrons. A flexible portable setup was developed with this purpose. We have used this setup to compare the equivalent proton fluences between the JPL method and a new method, proposed by Alurralde, for estimation of the damage produced in solar cells by the protons present in low-altitude orbits.

引用

页码：2380 / 2384

页数：5

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NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION B-BEAM INTERACTIONS WITH MATERIALS AND ATOMS, 2002, 187 (03) :345-353

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