Mapping the influence of stress on the surface elasticity with an atomic force microscope

被引：10

作者：

Finot, E ^{[1
]}

Lesniewska, E

Goudonnet, JP

Mutin, JC

机构：

[1] Univ Bourgogne, CNRS, LPUB 5027, F-21011 Dijon, France

[2] Univ Bourgogne, CNRS, LRRS 5613, F-21011 Dijon, France

来源：

APPLIED PHYSICS LETTERS | 1998年 / 73卷 / 20期

关键词：

D O I：

10.1063/1.122636

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

This letter reports an original experimental observation of the lateral stress effects on pure surface. The surface elasticity has been separated from topographical informations at the microscopic and atomic levels. The stress applied to the sample leads to modify the stiffness of the surface and affect the force modulation images. Measurements also revealed that the spring constant and the quality factor of cantilevers play an important role in the contrast mechanism of the elasticity images. (C) 1998 American Institute of Physics. [S0003-6951(98)03246-X].

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收藏

页码：2938 / 2940

页数：3

相关论文

共 17 条

[1] ATOMIC FORCE MICROSCOPE [J].

BINNIG, G ;

QUATE, CF ;

GERBER, C .

PHYSICAL REVIEW LETTERS, 1986, 56 (09) :930-933

[2] INTERACTION FORCES OF A SHARP TUNGSTEN TIP WITH MOLECULAR FILMS ON SILICON SURFACES [J].

BLACKMAN, GS ;

MATE, CM ;

PHILPOTT, MR .

PHYSICAL REVIEW LETTERS, 1990, 65 (18) :2270-2273

[3] PROBING THE SURFACE FORCES OF MONOLAYER FILMS WITH AN ATOMIC-FORCE MICROSCOPE [J].

BURNHAM, NA ;

DOMINGUEZ, DD ;

MOWERY, RL ;

COLTON, RJ .

PHYSICAL REVIEW LETTERS, 1990, 64 (16) :1931-1934

[4] A NONDESTRUCTIVE METHOD FOR DETERMINING THE SPRING CONSTANT OF CANTILEVERS FOR SCANNING FORCE MICROSCOPY [J].

CLEVELAND, JP ;

MANNE, S ;

BOCEK, D ;

HANSMA, PK .

REVIEW OF SCIENTIFIC INSTRUMENTS, 1993, 64 (02) :403-405

[5]

Finot E., 1996, Scanning Microscopy, V10, P697

[6] Reactivity of gypsum faces according to the relative humidity by scanning force microscopy [J].

Finot, E ;

Lesniewska, E ;

Mutin, JC ;

Goudonnet, JP .

SURFACE SCIENCE, 1997, 384 (1-3) :201-217

[7] Elastic deformations of tip and sample during atomic force microscope measurements [J].

Heuberger, M ;

Dietler, G ;

Schlapbach, L .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1996, 14 (02) :1250-1254

[8] MEASUREMENT OF NANOMECHANICAL PROPERTIES OF METALS USING THE ATOMIC-FORCE MICROSCOPE [J].

HUES, SM ;

DRAPER, CF ;

COLTON, RJ .

JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03) :2211-2214

[9] PROBLEMS IN TEMPERATURE CONTROL PERFORMING IN-SITU INVESTIGATIONS WITH THE SCANNING FORCE MICROSCOPE [J].

KIPP, S ;

LACMANN, R ;

SCHNEEWEISS, MA .

ULTRAMICROSCOPY, 1995, 57 (04) :333-335

[10]

Maivald P., 1991, Nanotechnology, V2, P103, DOI 10.1088/0957-4484/2/2/004