Soft-x-ray free-electron-laser interaction with materials

被引：37

作者：

Hau-Riege, Stefan P. ^{[1
]}

London, Richard A. ^{[1
]}

Chapman, Henry N. ^{[1
]}

Bergh, Magnus ^{[2
]}

机构：

[1] Lawrence Livermore Natl Lab, Livermore, CA 94551 USA

[2] Uppsala Univ, Biomed Ctr, SE-75123 Uppsala, Sweden

来源：

PHYSICAL REVIEW E | 2007年 / 76卷 / 04期

关键词：

D O I：

10.1103/PhysRevE.76.046403

中图分类号：

O35 [流体力学]; O53 [等离子体物理学];

学科分类号：

070204 ; 080103 ; 080704 ;

摘要：

Soft-x-ray free-electron lasers have enabled materials studies in which structural information is obtained faster than the relevant probe-induced damage mechanisms. We present a continuum model to describe the damage process based on hot-dense plasma theory, which includes a description of the energy deposition in the samples, the subsequent dynamics of the sample, and the detector signal. We compared the model predictions with experimental data and mostly found reasonable agreement. In view of future free-electron-laser performance, the model was also used to predict damage dynamics of samples and optical elements at shorter wavelengths and larger photon fluences than currently available.

引用

页数：12

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