Comparative analysis of layered materials using laser-induced plasma spectrometry and laser-ionization time-of-flight mass spectrometry

被引:34
作者
Garcia, CC
Vadillo, JM
Palanco, S
Ruiz, J
Laserna, JJ [1 ]
机构
[1] Univ Malaga, Fac Sci, Dept Analyt Chem, E-29071 Malaga, Spain
[2] Univ Malaga, Fac Sci, Dept Appl Phys, E-29071 Malaga, Spain
关键词
LIPS; time-of-flight mass spectrometry; depth-resolved analysis; layered materials;
D O I
10.1016/S0584-8547(01)00196-3
中图分类号
O433 [光谱学];
学科分类号
0703 ; 070302 ;
摘要
Laser-induced plasma spectrometry (LIPS) and laser ionization time-of-flight mass spectrometry (LI-TOFMS) have been evaluated for the in-depth analysis of layered materials. LI-TOFMS shares with LIPS important advantages in terms of speed of analysis and negligible sample handling. However, additional features such as real multielemental capabilities and the absence of background contribution must be added to the former. In order to have a useful estimation of the potential of each technique, an in-depth characterized Zn-coated steel has been analyzed. Without complete optimization of the system, the averaged ablation rate has been measured to be in the range 20-30 nm/pulse without beam conditioning or optical modifications. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:923 / 931
页数:9
相关论文
共 16 条
[1]   Converting spatial to pseudotemporal resolution in laser plasma analysis by simultaneous multifiber spectroscopy [J].
Bulatov, V ;
Krasniker, R ;
Schechter, I .
ANALYTICAL CHEMISTRY, 2000, 72 (13) :2987-2994
[2]  
Callister Jr W. D., 2013, MAT SCI ENG INTRO
[3]   Angle-resolved laser-induced breakdown spectrometry for depth profiling of coated materials [J].
García, CC ;
Corral, M ;
Vadillo, JM ;
Laserna, JJ .
APPLIED SPECTROSCOPY, 2000, 54 (07) :1027-1031
[4]   Identification of particulate materials by correlation analysis using a microscopic laser induced breakdown spectrometer [J].
Gornushkin, IB ;
Ruíz-Medina, A ;
Anzano, JM ;
Smith, BW ;
Winefordner, JD .
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY, 2000, 15 (06) :581-586
[5]   TRENDS IN SURFACE AND INTERFACE ANALYSIS [J].
GRASSERBAUER, M ;
FRIEDBACHER, G ;
HUTTER, H ;
STINGEDER, G .
FRESENIUS JOURNAL OF ANALYTICAL CHEMISTRY, 1993, 346 (6-9) :594-603
[6]   Laser ablation and arc/spark solid sample introduction into inductively coupled plasma mass spectrometers [J].
Günther, D ;
Jackson, SE ;
Longerich, HP .
SPECTROCHIMICA ACTA PART B-ATOMIC SPECTROSCOPY, 1999, 54 (3-4) :381-409
[7]   Characteristics of the secondary plasma induced by focusing a 10-mJ XeCl laser pulse at low pressures [J].
Kurniawan, H ;
Ishikawa, Y ;
Nakajima, S ;
Kagawa, K .
APPLIED SPECTROSCOPY, 1997, 51 (12) :1769-1780
[8]   Effect of sampling geometry on elemental emissions in laser-induced breakdown spectroscopy [J].
Multari, RA ;
Foster, LE ;
Cremers, DA ;
Ferris, MJ .
APPLIED SPECTROSCOPY, 1996, 50 (12) :1483-1499
[9]   Multielemental chemical imaging using laser-induced breakdown spectrometry [J].
Romero, D ;
Laserna, JJ .
ANALYTICAL CHEMISTRY, 1997, 69 (15) :2871-2876
[10]   Applications of laser-induced breakdown spectrometry [J].
Song, K ;
Lee, YI ;
Sneddon, J .
APPLIED SPECTROSCOPY REVIEWS, 1997, 32 (03) :183-235