Influence of roughness and interdiffusion in zone plate structures on the diffraction efficiency described by coupled wave theory

被引:16
作者
Schneider, G [1 ]
机构
[1] Univ Gottingen, Forsch Einrichtung Rontgenphys, D-37073 Gottingen, Germany
关键词
D O I
10.1063/1.121868
中图分类号
O59 [应用物理学];
学科分类号
摘要
Diffractive transmission x-ray optics, e.g., zone plates and gratings, are well suited for x-ray microscopy and spectroscopy. X-ray optics for use at short wavelengths require high zone aspect ratios which can be obtained by alternately depositing two materials with different x-ray scattering properties on a microwire. The roughness and the diffusion inherent to this process influence the diffraction efficiency of these optics. Using coupled wave theory, it is shown that roughness and interdiffusion increase the structure height required for optimal diffraction efficiency compared to ideally smooth structure profiles. In addition, the maximum obtainable diffraction efficiency decreases with increasing root-mean-square roughness and interdiffusion. (C) 1998 American Institute of Physics.
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页码:599 / 601
页数:3
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