Next generation SCADA security: Best practices and client puzzles
被引:18
作者:
Bowen, CL
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Virginia Tech, Blacksburg, VA 24060 USAVirginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Virginia Tech, Blacksburg, VA 24060 USA
Bowen, CL
[1
]
Buennemeyer, TK
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Virginia Tech, Blacksburg, VA 24060 USAVirginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Virginia Tech, Blacksburg, VA 24060 USA
Buennemeyer, TK
[1
]
Thomas, RW
论文数: 0引用数: 0
h-index: 0
机构:
Virginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Virginia Tech, Blacksburg, VA 24060 USAVirginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Virginia Tech, Blacksburg, VA 24060 USA
Thomas, RW
[1
]
机构:
[1] Virginia Polytech Inst & State Univ, Bradley Dept Elect & Comp Engn, Virginia Tech, Blacksburg, VA 24060 USA
来源:
Proceedings from the Sixth Annual IEEE Systems, Man and Cybernetics Information Assurance Workshop
|
2005年